The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Sep. 09, 2011
Applicants:

Hiroshi Terasaki, Tokyo, JP;

Tsunetada Konno, Tokyo, JP;

Mitsunobu Shimadzu, Tokyo, JP;

Kenzo Fujimoto, Ishikawa, JP;

Takashi Sakamoto, Ishikawa, JP;

Inventors:

Hiroshi Terasaki, Tokyo, JP;

Tsunetada Konno, Tokyo, JP;

Mitsunobu Shimadzu, Tokyo, JP;

Kenzo Fujimoto, Ishikawa, JP;

Takashi Sakamoto, Ishikawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/686 (2013.01); C12Q 1/6858 (2013.01);
Abstract

Provided is a method for rapidly and easily detecting a mutated nucleic acid, which is contained in a small amount in a nucleic acid sample together with wild-type nucleic acids, with high specificity and high sensitivity. In the method of the present invention, amplification of a detection region comprising a target site by a nucleic acid amplification method is inhibited, by the steps of allowing a nucleic acid having a target site to coexist with a clamp probe comprising a photo-crosslinking nucleic acid and having a sequence complementary to the target site, and photo-crosslinking the nucleic acid having the target site with the clamp probe by photo-irradiation.


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