The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Feb. 03, 2016
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Yutaka Hayakawa, Kariya, JP;

Hisanori Yokura, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01); G01L 9/00 (2006.01); H01L 21/18 (2006.01); H01L 21/20 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00357 (2013.01); G01L 9/0042 (2013.01); G01L 9/0051 (2013.01); B81B 2201/0264 (2013.01); B81B 2203/0127 (2013.01); H01L 21/187 (2013.01); H01L 21/2007 (2013.01);
Abstract

A manufacturing method of a semiconductor device, in which a vacuum-pressure airtight chamber is defined by a space between a first substrate and a recessed portion of a second substrate, includes preparing the first substrate and the second substrate both of which contain silicon, joining the two substrates together, performing a heat treatment to emit hydrogen gas from the airtight chamber, and generating OH groups on the substrates before the joining. In the joining of the substrates together, the OH groups are bonded together to generate covalent bonds, and in the heat treatment, a part on which the OH groups are generated is heated at a temperature rise rate of 1° C./sec or smaller until a temperature of the substrate increases to 700° C. or higher, and a heating temperature and heating time are adjusted to emit hydrogen gas from the airtight chamber.


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