The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 17, 2018

Filed:

Mar. 27, 2017
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Masayuki Ukishima, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); H04N 1/00 (2006.01); B41J 29/38 (2006.01); B41J 2/21 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/2142 (2013.01); B41J 2/2146 (2013.01); B41J 29/38 (2013.01); H04N 1/00005 (2013.01); H04N 1/00034 (2013.01); H04N 1/00037 (2013.01); H04N 1/00251 (2013.01); B41J 2029/3935 (2013.01);
Abstract

At least a part of an inspection image is divided into a finite number of local regions by allowing overlap in a first direction. A streak intensity signal quantitatively showing intensity of a streak for a position in a second direction intersecting with the first direction is created for each of the local regions. A position of a streak-like signal is detected by using each of at least one of T thresholds, where T is 1 or more. Presence or absence of a streak is determined for a position in accordance with the number of times of detection for each of thresholds in a local region group composed of two or more local regions connecting in the first direction. The number of times of detection required for determining that there is a streak for at least one of the thresholds is two or more.


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