The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Aug. 14, 2015
Applicant:
Spectrum Effect Inc., Seattle, WA (US);
Inventors:
Jungnam Yun, Seattle, WA (US);
Rekha Menon, Seattle, WA (US);
Assignee:
SPECTRUM EFFECT INC., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 16/22 (2009.01); H04B 17/318 (2015.01); H04W 4/02 (2018.01); H04W 24/02 (2009.01); H04B 17/345 (2015.01); H04W 88/02 (2009.01); H04W 24/04 (2009.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 16/22 (2013.01); H04B 17/318 (2015.01); H04B 17/345 (2015.01); H04W 4/026 (2013.01); H04W 24/02 (2013.01); H04W 24/04 (2013.01); H04W 24/10 (2013.01); H04W 88/02 (2013.01);
Abstract
Transmitter localization and signal mapping may be accomplished by receiving measurement data from a plurality of nodes, the measurement data including a signal strength value and a geographic location for the signal strength value, triangulating the plurality of measurements using triangulation, and establishing at least one contour representing a level of signal strength. A system may receive measurement data from a plurality of user equipment, and use that data to localize an interference source and create a contour map.