The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Dec. 19, 2012
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Nobuyuki Watanabe, Yokohama, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/571 (2017.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0207 (2013.01); G06T 7/571 (2017.01); G02B 21/365 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/20052 (2013.01);
Abstract

An image processing system includes an acquisition unit, a candidate value estimation unit, a cutoff frequency acquisition unit and a candidate value modification unit. The acquisition unit is configured to acquire an image of a sample taken via an optical system. The candidate value estimation unit is configured to estimate a candidate value of a 3D shape of the sample based on the image. The cutoff frequency acquisition unit is configured to acquire a cutoff frequency of the optical system based on information of the optical system. The candidate value modification unit is configured to perform at least one of data correction and data interpolation for the candidate value based on the cutoff frequency and calculate a modified candidate value.


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