The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Mar. 22, 2017
Rockley Photonics Limited, London, GB;
Guy Regev, Pasadena, CA (US);
Daniel Brunina, Pasadena, CA (US);
Nathan Farrington, Arcadia, CA (US);
Thomas Pierre Schrans, Temple City, CA (US);
Chiang Yeh, Sierra Madre, CA (US);
Rockley Photonics Limited, London, GB;
Abstract
A system and method for measuring propagation delays and other delays in an optical switching system. A transmitter is connected, through a circuit switch, to a receiver. To measure the propagation delay between the transmitter and the receiver, the transmitter sends one or more time-tagged ranging messages and the receiver calculates a propagation delay from the difference between the time of receipt and the time of transmission. In another embodiment, a time delay between message transmission and transition of a CDR of the receiver to a fast acquisition mode is adjusted, by trial and error, to find a range of such time delays for which transmission is successful. A time delay between the transmitter and the switch is measured by establishing or breaking the connection and determining, for various tentative time delay values, whether transmission succeeds.