The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Dec. 15, 2015
Futurewei Technologies, Inc., Plano, TX (US);
Liang Gu, San Jose, CA (US);
Yuming Cao, Pleasanton, CA (US);
Yifan Gu, Santa Clara, CA (US);
Hungyi Lee, Cupertino, CA (US);
Gong Lei, Sunnyvale, CA (US);
Yen Dang, San Jose, CA (US);
Mamatha Deshpande, San Jose, CA (US);
Shou-Po Shih, Cupertino, CA (US);
Yan Duan, Ames, IA (US);
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
An apparatus comprising a semiconductor chip that comprises an optical modulator configured to modulate an optical signal based on a received driver signal, a voltage-mode (VM) driver coupled to the optical modulator and configured to produce a level-shifted driver signal to modulate the optical signal, and a two-stage test interface coupled to the optical modulator and configured to receive and test the level shifted driver signal. The two-stage test interface comprises a voltage equalization stage coupled to an output-terminated buffer stage, the VM driver comprises a two-stage VM Mach-Zehnder modulator (MZM) driver that comprises a pre-driver coupled to a VM level-shifter (VMLS). The apparatus further comprises a resistor coupled to an output of the buffer stage, wherein the resistor comprises an amount of resistance that matches a termination resistance of a test equipment. The termination resistance is about 50 ohm (Ω).