The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Dec. 23, 2016
Applicant:

Stc.unm, Albuquerque, NM (US);

Inventors:

Sang Eon Han, Albuquerque, NM (US);

Brittany R. Hoard, Albuquerque, NM (US);

Sang M. Han, Albuquerque, NM (US);

Swapnadip Ghosh, Albuquerque, NM (US);

Assignee:

STC.UNM, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/14 (2006.01); H01L 31/0236 (2006.01); H01L 31/0747 (2012.01); H01L 31/18 (2006.01); H01L 31/20 (2006.01); G02B 1/00 (2006.01); H03H 9/145 (2006.01); H03H 9/10 (2006.01); H03H 9/25 (2006.01);
U.S. Cl.
CPC ...
H01L 31/02363 (2013.01); G02B 1/005 (2013.01); H01L 31/0747 (2013.01); H01L 31/1804 (2013.01); H01L 31/202 (2013.01); H03H 9/10 (2013.01); H03H 9/145 (2013.01); H03H 9/25 (2013.01);
Abstract

Provided is a method for fabricating a nanopatterned surface. The method includes forming a mask on a substrate, patterning the substrate to include a plurality of symmetry-breaking surface corrugations, and removing the mask. The mask includes a pattern defined by mask material portions that cover first surface portions of the substrate and a plurality of mask space portions that expose second surface portions of the substrate, wherein the plurality of mask space portions are arranged in a lattice arrangement having a row and column, and the row is not oriented parallel to a [110] direction of the substrate. The patterning the substrate includes anisotropically removing portions of the substrate exposed by the plurality of spaces.


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