The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Jun. 10, 2015
Applicant:

Invisage Technologies, Inc., Menlo Park, CA (US);

Inventors:

Edward Hartley Sargent, Toronto, CA;

Jess Jan Young Lee, Woodside, CA (US);

Emanuele Mandelli, Menlo Park, CA (US);

Jae Park, Menlo Park, CA (US);

Assignee:

INVISAGE TECHNOLOGIES, INC., Newark, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); H01L 27/146 (2006.01); H04N 5/359 (2011.01); H04N 5/3745 (2011.01); H04N 5/378 (2011.01); H04N 5/33 (2006.01); H04N 5/347 (2011.01); H04N 5/361 (2011.01); H04N 9/04 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1461 (2013.01); H01L 27/1463 (2013.01); H01L 27/1467 (2013.01); H01L 27/14607 (2013.01); H01L 27/14618 (2013.01); H01L 27/14634 (2013.01); H01L 27/14643 (2013.01); H01L 27/14665 (2013.01); H04N 5/33 (2013.01); H04N 5/347 (2013.01); H04N 5/359 (2013.01); H04N 5/361 (2013.01); H04N 5/378 (2013.01); H04N 5/37452 (2013.01); H04N 9/045 (2013.01); H01L 2224/48091 (2013.01);
Abstract

Various embodiments include methods and apparatuses for forming and using pixels for image sensors. In one embodiment, an image sensor is disclosed. The image sensor includes an optically sensitive material; a plurality of electrodes proximate the optically sensitive material, including at least a first electrode, a second electrode and a third electrode; and a charge store. The first electrode is coupled to the charge store, and the first electrode and the second electrode are configured to provide a bias to the optically sensitive material to direct photocarriers to the charge store. Other methods and apparatuses are disclosed.


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