The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Feb. 22, 2017
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Manjunatha Divakara, Bangalore, IN;

Sudhindra D. Mewundi, Bangalore, IN;

Tomas Brodsky, Cortland Manor, NY (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 29/00 (2006.01); G08B 29/18 (2006.01); G08B 21/18 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G08B 29/188 (2013.01); G08B 21/182 (2013.01); G08B 29/183 (2013.01); H04L 67/12 (2013.01);
Abstract

A data analysis system and approach having sensors, a collective processing mechanism connected to the sensors, and a threshold logic panel connected to the collective processing mechanism. Raw data from the sensors may be subject to collective processing and collective threshold logic analysis. The collective processing mechanism and the threshold logic panel may be situated outside of or in the cloud. Big data analytics may be performed on the data. The sensors may be homogeneous or heterogeneous. Consequently, there may be data fusion for false alarm reduction and advanced alarm detection, and application of big data analysis. Raw data may be used for determining positional information.


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