The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Jul. 01, 2016
Applicant:

Xtralis Technologies Ltd, Nassau, NP, BS;

Inventors:

Tawfeeq Gehad Al-Farra, East Bentleigh, AU;

Alasdair James Williamson, Worthing, GB;

John Vythoulkas, Brunswick, AU;

Giuseppe Leslie Fiusco, Glen Iris, AU;

Ghassan Habelrih, Montreal, CA;

Rajiv Singh, Glen Waverley, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G08B 17/12 (2006.01); G08B 17/10 (2006.01); G08B 29/18 (2006.01); G08B 17/02 (2006.01); G08B 25/00 (2006.01); G08B 29/04 (2006.01); G08B 17/00 (2006.01);
U.S. Cl.
CPC ...
G08B 17/12 (2013.01); G08B 17/02 (2013.01); G08B 17/10 (2013.01); G08B 25/002 (2013.01); G08B 29/185 (2013.01); G08B 17/00 (2013.01); G08B 29/043 (2013.01);
Abstract

A particle detection system including a particle detector in fluid communication with at least two sample inlets for receiving a sample flow from a monitored region. The particle detector includes detection means for detecting the level of particles within the sample flow and outputting a first signal indicative of the level of particles within the sample flow. A flow sensor is located downstream of the sample inlets for measuring the flow rate of the sample flow and outputting a second signal indicative of the flow rate of the sample flow. At least a first sample inlet is normally open to the monitored region for receiving at least part of the sample flow. At least a second sample inlet is normally closed to the monitored region but is openable to the monitored region in response to a change in environmental conditions in the monitored region. The particle detection system further includes processing means adapted for receiving the first and second signals and comparing the first signal to a predetermined threshold level and comparing the second signal to a predetermined threshold flow rate, and generating an output signal based on the respective comparisons of the first and second signals. A method of particle detection is also described.


Find Patent Forward Citations

Loading…