The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Apr. 27, 2015
The Regents of the University of California, Oakland, CA (US);
Roland Henry, San Francisco, CA (US);
Stephen Hauser, San Francisco, CA (US);
Alyssa Zhu, San Francisco, CA (US);
Esha Datta, San Francisco, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
Methods and systems are provided for the automated detection and analysis of structural tissue alterations related to myelin and axons/neurons in one or more biological structures of a patient's nervous system obtained from data from a medical imaging system, or the initial sensing or data collection processes such as, those that could be used to generate an image. In some embodiments, the method comprises, at a system having a memory and one or more processor for processing and displaying images of the biological structure, computationally processing at least a T1 weighted magnetic resonance image of the structure and a T2 weighted magnetic resonance image of the structure in order to analyze at least a portion of the structure of the nervous system using a plurality of stored tissue classifier elements to determine if the portion of the structure correlates with the presence of myelin. Such methods are useful for the detection of diseases associated with demyelination.