The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

May. 05, 2016
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Postech Academy-industry Foundation, Pohang-si, KR;

Inventors:

Bohyung Han, Seoul, KR;

Seunghoon Hong, Seoul, KR;

Hyeonwoo Noh, Gunpo-si, KR;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4628 (2013.01); G06K 9/6272 (2013.01);
Abstract

An object recognition apparatus and method thereof are disclosed. An exemplary apparatus may determine an image feature vector of a first image by applying a convolution network to the first image. The convolution network may extract features from image learning sets that include the first image and a sample segmentation map of the first image. The exemplary apparatus may determine a segmentation map of the first image by applying a deconvolution network to the determined image feature vector. The exemplary apparatus may determine a weight of the convolution network and a weight of the deconvolution network based on the sample segmentation map and the first segmentation map. The exemplary apparatus may determine a second segmentation map of a second image through the convolution network using the determined weight of the convolution network and through the deconvolution network using the determined weight of the deconvolution network.


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