The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Feb. 13, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael B. Healy, White Plains, NY (US);

Hillery C. Hunter, Chappaqua, NY (US);

Charles A. Kilmer, Essex Junction, VT (US);

Kyu-hyoun Kim, Chappaqua, NY (US);

Warren E. Maule, Cedar Park, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 11/07 (2006.01); G11C 7/24 (2006.01); G11C 11/40 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 11/073 (2013.01); G06F 11/076 (2013.01); G06F 11/0793 (2013.01); G11C 7/24 (2013.01); G06F 2221/034 (2013.01); G11C 11/40 (2013.01); G11C 2029/0411 (2013.01);
Abstract

Embodiments of the present disclosure provide a method, computer program product, and system for monitoring a dynamic random-access memory (DRAM) device to detect and respond to a cryogenic attack. A processor receives a set of memory information about a DRAM device. The processor then determines a set of error indicators by processing the memory information using a set of decision parameters. The error indicators are then compared to an attack syndrome to determine if the DRAM is experiencing a cryogenic attack. If the DRAM is experiencing a cryogenic attack, access to the DRAM device is disabled.


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