The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Feb. 08, 2017
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Young Pil Kim, Eden Prairie, MN (US);

Antoine Khoueir, Apple Valley, MN (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/12 (2006.01); G06F 12/02 (2006.01); G11C 16/10 (2006.01); G11C 16/28 (2006.01); G11C 16/34 (2006.01); G11C 16/14 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G11C 16/10 (2013.01); G11C 16/14 (2013.01); G11C 16/28 (2013.01); G11C 16/3459 (2013.01); G06F 2212/7201 (2013.01);
Abstract

Method and apparatus for managing data in a stacked semiconductor memory, such as but not limited to a three dimensional (3D) NAND flash memory array. In some embodiments, a data set is written to the memory array by programming a stack of memory cells to a desired set of program states. A first set of pulses is applied to verify the memory cells conform to the desired set of program states. The verified stack of memory cells are subsequently conditioned by applying a second set of pulses to remove accumulated charge from a shared channel region of the stack. The conditioning of the memory cells reduces a step-wise increase in the number of read errors during the first read operation as compared to subsequent read operations on the memory cells.


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