The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Aug. 29, 2014
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Mark Stephan Shurtleff, Oakland, CA (US);

Wenhui Yu, Sunnyvale, CA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 19/00 (2018.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3065 (2013.01); G06F 19/3406 (2013.01); G06F 19/3431 (2013.01); H04L 43/00 (2013.01);
Abstract

In one embodiment, a method includes receiving a plurality of measurements, each measurement associated with a different parameter, calculating an index based on the measurements, and generating a visual index display indicating the index, the visual index display comprising a first portion and a second portion, each portion configured for selection by a user. A first set of measurements is displayed when the first portion is selected and a second set of measurements is displayed when the second portion is selected. The first set of measurements is a subset of the second set of measurements. An apparatus and logic are also disclosed herein.


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