The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Jun. 29, 2016
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Kenichiro Abe, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 9/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 9/64 (2013.01);
Abstract

A microscope optical system includes a first lens group having a positive power, a second lens group, and a third lens group including a positive lens. The first lens group includes: a first lens component arranged closest to an object, the first lens component including a first meniscus lens that has a meniscus shape with a concave surface facing the object side; a second lens component having a positive power that has a meniscus lens shape with the concave surface facing the object side; and a cemented lens including a positive lens and a negative lens that is made of a higher-dispersion material than a material of the positive lens. When NA, β, D, Drepresent a numerical aperture of the microscope optical system, a lateral magnification of the third lens group, a spacing between the third lens group and an image plane, a spacing between the second lens group and the third lens group, the microscope optical system satisfies the following conditional expressions:0.25<NA≤1.51   (1);0.2<β<3   (2);0.1<<2.5   (3).


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