The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Jan. 09, 2015
Applicant:
Chevron U.s.a. Inc., San Ramon, CA (US);
Inventors:
Assignee:
Chevron U.S.A. Inc., San Ramon, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/28 (2006.01); G01V 1/30 (2006.01); E21B 43/26 (2006.01); G01V 1/50 (2006.01);
U.S. Cl.
CPC ...
G01V 1/288 (2013.01); E21B 43/26 (2013.01); G01V 1/282 (2013.01); G01V 1/305 (2013.01); G01V 1/50 (2013.01); G01V 2210/123 (2013.01); G01V 2210/1234 (2013.01); G01V 2210/1429 (2013.01); G01V 2210/65 (2013.01); G01V 2210/66 (2013.01);
Abstract
A method for locating a microseismic event in a subsurface formation, in some embodiments, comprises: receiving a microseismic signal at a detector; obtaining a velocity model representative of the subsurface formation, the velocity model comprising multiple velocity layers; estimating, for each of the multiple velocity layers in the subsurface formation, a microseismic event location and a microseismic event origin time; and selecting one of the estimated locations and times using a parameter of the microseismic signal received at the detector.