The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Jan. 09, 2015
Applicant:
Ohio State Innovation Foundation, Columbus, OH (US);
Inventors:
Rizwan Ahmad, Columbus, OH (US);
Orlando P. Simonetti, Columbus, OH (US);
Yu Ding, Hilliard, OH (US);
Assignee:
Ohio State Innovation Foundation, Columbus, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/561 (2006.01); G01R 33/48 (2006.01); G01R 33/56 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5619 (2013.01); G01R 33/4818 (2013.01); G01R 33/482 (2013.01); G01R 33/4824 (2013.01); G01R 33/4826 (2013.01); G01R 33/5608 (2013.01); G01R 33/56325 (2013.01);
Abstract
A pseudo-random, incoherent sampling technique, called Variable density Incoherent Spatiotemporal Acquisition (VISTA) is disclosed, which is based on minimal Riesz energy problem. Compared with other pseudorandom methods (e.g., PDS), VISTA has the unique ability to incorporate a variety of problem-specific constraints. In this study, VISTA was applied to real-time CMR, where it not only provided an incoherent sampling with variable density but also ensured a constant temporal resolution and a fully sampled time-averaged data.