The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Oct. 14, 2015
Omron Corporation, Kyoto-shi, Kyoto, JP;
Tetsuya Fukumoto, Kusatsu, JP;
Toshiyuki Higuchi, Kusatsu, JP;
Kohei Murakami, Kusatsu, JP;
Satoshi Fujii, Kusatsu, JP;
OMRON Corporation, Kyoto-shi, JP;
Abstract
The reliability of testing a normally closed contact in a relay unit may involve the following. Sending a first test signal to the first normally closed contact and detecting a return state of the first test signal sent, sending a second test signal different from the first test signal to the second normally closed contact and detecting a return state of the second test signal sent; and assessing an abnormality when at least one of the detection result for the return state of the first test signal does not satisfy a first predetermined criteria, and the detection result of the return state of the second test signal does not satisfy a second predetermined criteria different from the first predetermined criteria.