The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
May. 15, 2014
Kimal Plc, Uxbridge, Middlesex, GB;
Raymond Glocker, Aschaffenburg, DE;
Kimal PLC, Uxbridge, GB;
Abstract
A probe () for measuring biomolecules by means of electrochemical impedance spectroscopy is proposed, having a distal end () and a proximal end (), wherein the probe () has the following structure in a cross-section oriented transversely to its longitudinal extent: a base layer () of an insulating material, on a first side of the base layer () at least one layer () of a conducting material, on a second side of the base layer (), which is remote from the first side of the base layer (), at least one layer () of a conducting material, and on the side of the layers of conducting material that is remote from the base layer (), on the outside, in each case an outer layer () of an insulating material, wherein further the at least one layer () of a conducting material on the first side of the base layer () is formed into an annular conductor structure () in the region of the distal end () of the probe, wherein the annular conductor structure () is followed proximally by at least one elongate conductor () which is in the form of a feed line for the annular conductor structure and extends to the proximal end () of the probe (), and wherein the at least one layer () of a conducting material on the second side of the base layer () covers the predominant part of the base surface of the base layer (), wherein the layer () of a conducting material on the second side of the base layer () has in the region of the distal end () of the probe () a polygonal hole () which is arranged concentrically to the annular conductor structure ().