The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Mar. 28, 2013
Applicant:

Denka Seiken Co., Ltd., Tokyo, JP;

Inventors:

Mayumi Kano, Gosen, JP;

Ritsuko Tachibana, Gosen, JP;

Masayuki Iizuka, Gosen, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); C08F 210/14 (2006.01); C08F 222/02 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54393 (2013.01); C08F 210/14 (2013.01); C08F 222/02 (2013.01); G01N 33/5306 (2013.01); G01N 33/54313 (2013.01);
Abstract

Disclosed are an immunoassay method which can measure an antigen with high sensitivity and accuracy; and a reagent therefor. In the immunoassay method, an antigen-antibody reaction and/or a measurement is(are) carried out in the presence of a polycarboxylic acid type surfactant. The immunoassay reagent for use in the method is characterized by comprising the polycarboxylic acid type surfactant. By employing such a simple means that the polycarboxylic acid type surfactant is allowed to be present in the reaction and/or measurement system, non-specific reactions can be suppressed effectively even in a highly sensitive immunoassay, and an antigen can be measured accurately and specificity can be improved in the immunoassay.


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