The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Oct. 02, 2013
Applicant:

Surf Technology As, Trondheim, NO;

Inventors:

Bjørn A. J. Angelsen, Trondheim, NO;

Rune Hansen, Trondheim, NO;

Tonni F. Johansen, Trondheim, NO;

Svein-Erik Måsøy, Trondheim, NO;

Sven Peter Nasholm, Oslo, NO;

Thor Andreas Tangen, Trondheim, NO;

Assignee:

SURF Technology AS, Trondheim, NO;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); G01N 29/34 (2006.01); G01S 7/52 (2006.01); A61B 8/08 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
G01N 29/343 (2013.01); A61B 8/08 (2013.01); A61B 8/485 (2013.01); G01S 7/52022 (2013.01); G01S 7/52038 (2013.01); G01S 7/52077 (2013.01); G01S 7/52095 (2013.01); G01S 15/8952 (2013.01); G01S 7/52049 (2013.01); G01S 15/8929 (2013.01);
Abstract

Measurement or imaging of elastic wave nonlinear scatterers with a memory of scattering parameters comprises selecting LF pulses having characteristics to change the scattering parameters of nonlinear scatterers. A transmit time relation is selected so that the incident HF pulse propagates sufficiently close to the LF pulse that the effect of the incident LF pulse on its scatterer parameters is observed by the HF pulse. At least two elastic wave pulse complexes comprising a high frequency (HF) pulse and a selected low frequency (LF) pulse are transmitted towards the region. Received HF signals are combined to form nonlinear HF signals representing the scatterers with memory, with suppression of received HF signals from other scatterers. At least one of the received HF signals may be corrected by time delay correction and/or speckle correction with a speckle correction filter, determined by movement of the scattering object. Systems are also disclosed.


Find Patent Forward Citations

Angelsen, Bjørn A. J.. (2018). Measurement and imaging of scatterers with memory of scatterer parameters using at least two-frequency elastic wave pulse complexes (U.S. Patent No. 9939413). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9939413

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