The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Aug. 03, 2016
Applicant:
Battelle Memorial Institute, Richland, WA (US);
Inventors:
Yehia M. Ibrahim, Richland, WA (US);
Sandilya Garimella, Richland, WA (US);
Spencer A. Prost, Richland, WA (US);
Assignee:
Battelle Memorial Institute, Richland, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/00 (2006.01); G01N 27/62 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); H01J 49/0031 (2013.01); H01J 49/425 (2013.01);
Abstract
Described herein are examples of systems and methods for integrating IMS and MS systems. In certain examples, systems and methods for decoding double multiplexed data are described. The systems and methods can also perform multiple refining procedures in order to minimize the demultiplexing artifacts. The systems and methods can be used, for example, for the analysis of proteomic and petroleum samples, where the integration of IMS and high mass resolution are used for accurate assignment of molecular formulae.