The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Apr. 17, 2017
Applicant:

Cummins Filtration Ip, Inc., Columbus, IN (US);

Inventors:

Carlos Lana, Columbus, IN (US);

Baohua Qi, Columbus, IN (US);

Assignee:

CUMMINS FILTRATION IP, INC., Columbus, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/20 (2006.01); G01N 27/16 (2006.01); F01N 11/00 (2006.01); F02B 77/08 (2006.01); B01D 53/94 (2006.01); F01N 3/08 (2006.01); F01N 3/20 (2006.01); G01M 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 27/16 (2013.01); B01D 53/94 (2013.01); F01N 3/0814 (2013.01); F01N 3/20 (2013.01); F01N 11/002 (2013.01); F02B 77/086 (2013.01); G01M 15/102 (2013.01); F01N 2550/24 (2013.01); F01N 2900/1404 (2013.01);
Abstract

A system to detect the presence of a catalyst includes an exhaust gas tube, a first temperature sensing device, a second temperature sensing device, a flow rate measurement device, and a processing device. The first temperature sensing device measures a first temperature of exhaust gas upstream of the exhaust gas tube. The second temperature sensing device measures a second temperature of the exhaust gas downstream of the exhaust gas tube. The processing device estimates an expected time delay between the measured inlet and outlet exhaust gas temperatures corresponding to a system with a catalyst present. The processing device may also determine the presence of a catalyst by comparing the measured second temperature to the measured first temperature and comparing the measured second temperature to an estimated delayed first temperature associated with the expected time delay.


Find Patent Forward Citations

Loading…