The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Sep. 11, 2014
Applicant:
The United States of America, As Represented BY the Secretary, Department of Health and Human Services, Washington, DC (US);
Inventors:
Han Wen, Bethesda, MD (US);
Houxun Miao, Rockville, MD (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01);
Abstract
X-ray grating based and grid based imagers formed a fringe pattern modulated by a specimen. An X-ray beam is scanned so that the fringe pattern is modulated by these specimen along a plurality of projection directions. Corresponding fringe patterns are detected and aligned so as to produce a specimen phase image. X-ray beam scanning is based on electric or magnetic deflection of an electron beam to an X-ray generating target.