The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Nov. 11, 2014
Applicant:
Ishida Co., Ltd., Kyoto, JP;
Inventors:
Assignee:
Ishida Co., Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/59 (2006.01); G01N 21/90 (2006.01); G01N 21/94 (2006.01); G01N 21/95 (2006.01); G01N 21/84 (2006.01); G01N 21/89 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/59 (2013.01); G01N 21/90 (2013.01); G01N 21/94 (2013.01); G01N 21/95 (2013.01); G01N 21/8901 (2013.01); G01N 2021/845 (2013.01); G01N 2201/062 (2013.01);
Abstract
An optical inspection apparatusincludes a light radiation unitconfigured to radiate light to an article, a light detection unitconfigured to detect transmitted light of the light radiated to the article, and a support unitconfigured to support the light radiation unitand the light detection unitin a cantilever manner. An inspection region of the articleby the light is exposed to an ambient atmosphere.
Okamoto, Tsutomu. (2018). Optical inspection device (U.S. Patent No. 9939387). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9939387
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile