The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Apr. 07, 2017
Applicant:
Vidrio Technologies, Llc, Ashburn, VA (US);
Inventors:
Bruce Kimmel, Ashburn, VA (US);
Jonathan King, Ashburn, VA (US);
Nathan Clack, Ashburn, VA (US);
Georg Jaindl, Ashburn, VA (US);
Assignee:
VIDRIO TECHNOLOGIES, LLC, Ashburn, VA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G02B 21/002 (2013.01); G02B 21/02 (2013.01); G02B 21/16 (2013.01); G01N 2021/6478 (2013.01); G01N 2201/105 (2013.01); G01N 2201/127 (2013.01);
Abstract
The invention relates to multi-photon excitation microscopy, and in particular to a path planning module and calibration module for three mirror adaptive sampling system configured to automatically generate an optimized RGG mirror scanning path by scanning a Field of View, identifying multiple region of interest targets, and analyzing the targets to generate an optimized path. The invention also relates to methods for maintaining a high frame rate during wide field of view sampling.