The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Feb. 20, 2015
Malvern Instruments Limited, Malvern Worcestershire, GB;
E. Neil Lewis, Olney, MD (US);
John McCaffrey, Columbia, MD (US);
Vishal Patil, Columbia, MD (US);
Kenneth Haber, Brookeville, MD (US);
Malvern Instruments Limited, Malvern, GB;
Abstract
The invention relates to methods and apparatus for detecting properties of heterogeneous samples, including detecting properties of particles or fluid droplets in industrial processes. Embodiments disclosed include a particle characterization method, comprising: providing a fluid containing suspended particles; causing at least a first subset of the suspended particles to flow past a first two-dimensional array detector (); illuminating the first subset of suspended particles as they flow past the first two-dimensional array detector () in the fluid; acquiring a plurality of images of the first subset of particles as they flow past the first two-dimensional array detector () in the fluid; and automatically counting the particles in the images.