The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Jun. 17, 2015
Lavision Gmbh, Goettingen, DE;
Bernhard Wieneke, Goettingen, DE;
LaVision GmbH, , DE;
Abstract
An inherent pattern image (F) of a test object () is recorded when the test object is illuminated with uniform illumination light, and a projection pattern image (F) is recorded when the test object is illuminated with a spatially modulated projection pattern. A planar displacement vector field (F) is calculated from the inherent pattern image, and a shape (F) is calculated from the projection pattern image. An image of the first type is recorded at time (t), and images of the second type are recorded at times (t; t) before and after the time (t). A representation of the test object at the test time (t) is estimated by averaging. A spatial displacement vector field () is based on the calculated representation of the test object of the first image type and the representation of the test object estimated from the images of the second type.