The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Jan. 08, 2016
Applicant:

Modumetal, Inc., Seattle, WA (US);

Inventors:

John D. Whitaker, Seattle, WA (US);

Zhi Liang Bao, Seattle, WA (US);

Assignee:

Modumetal, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/10 (2006.01); C25D 5/18 (2006.01); C25D 3/66 (2006.01); C25D 5/16 (2006.01); C25D 3/20 (2006.01); C25D 17/10 (2006.01);
U.S. Cl.
CPC ...
C25D 5/10 (2013.01); C25D 3/20 (2013.01); C25D 3/665 (2013.01); C25D 5/16 (2013.01); C25D 5/18 (2013.01); C25D 17/10 (2013.01);
Abstract

A method of making property modulated composite materials includes depositing a first layer of material having a first microstructure/nanostructure on a substrate followed by depositing a second layer of material having a second microstructure/nanostructure that differs from the first layer. Multiple first and second layers can be deposited to form a composite material that includes a plurality of adjacent first and second layers. By controlling the microstructure/nanostructure of the layers, the material properties of the composite material formed by this method can be tailored for a specific use. The microstructures/nanostructures of the composite materials may be defined by one or more of grain size, grain boundary geometry, crystal orientation, and a defect density.


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