The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Feb. 02, 2017
Fujifilm Corporation, Tokyo, JP;
Yoshirou Yamazaki, Tokyo, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
This object is solved by a device for inspecting a print material, including evaluation value acquisition means for inspecting a plurality of print materials and acquiring an evaluation value indicating quality of each print material, allowed-number-of-failed-product acquisition means for acquiring an allowed number of failed products among the plurality of print materials, determination criterion determination means for determining a determination criterion in which the number of failed products is equal to or smaller than the allowed number of failed products and a sum of evaluation values of passed products becomes a highest-quality value, pass and fail determination means for determining pass or fail of each print material on the basis of the determination criterion and the evaluation value of each print material, and output means for outputting a determination result of the pass and fail determination means.