The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Nov. 05, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seokmin Han, Seongnam-si, KR;

Dong-Goo Kang, Hwaseong-si, KR;

Young Hun Sung, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5241 (2013.01); A61B 6/502 (2013.01); A61B 6/583 (2013.01); A61B 6/461 (2013.01); A61B 6/481 (2013.01); A61B 6/482 (2013.01);
Abstract

An X-ray imaging apparatus can include an X-ray detector configured to acquire X-ray data by detecting X-rays and an image processor configured to segment a first image generated based on the acquired X-ray data into two or more segmentation regions, to identify one or more materials present in one segmentation region of the two or more segmentation regions, and to acquire an image relating to an object which includes abnormal materials.


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