The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Mar. 19, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Manami Hikosaka, Yokohama, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/467 (2013.01); A61B 6/465 (2013.01); A61B 6/54 (2013.01); A61B 6/545 (2013.01); A61B 8/465 (2013.01); A61B 8/54 (2013.01); A61B 6/4208 (2013.01);
Abstract
A control apparatus for an X-ray imaging system obtains examination information including a plurality of imaging techniques and a plurality of imaging conditions corresponding to the plurality of imaging techniques. When the content of a condition item of the imaging condition selected from the plurality of imaging conditions is changed in accordance with an operation input from the operator, the control apparatus applies the change to an imaging condition other than the selected imaging condition of the plurality of imaging conditions.