The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Apr. 13, 2012
Applicants:

Igor Gofman, Croton-on-Hudson, NY (US);

Mu Wu, Hopewell Junction, NY (US);

Inventors:

Igor Gofman, Croton-on-Hudson, NY (US);

Mu Wu, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); A61B 5/145 (2006.01); A61B 5/1486 (2006.01);
U.S. Cl.
CPC ...
A61B 5/145 (2013.01); A61B 5/14532 (2013.01); A61B 5/14865 (2013.01); A61B 2560/0276 (2013.01);
Abstract

Embodiments herein provide detection of contamination at one or more contacts of a sensor system. The sensor system includes a sensor assembly and an electronics assembly communicatively coupled together by one or more contacts. The sensor assembly passes a sensor signal to the electronics assembly for further processing. The electronics assembly includes a detection contact for detecting contamination on or near one or more contacts of the sensor assembly and/or the electronics assembly. A switch selectively couples the detection contact to a bias voltage during a measurement mode and to a reference voltage during a detection mode, the reference voltage being different from the bias voltage. A method of contamination detection includes switching the electronics assembly between the measurement mode and the detection mode, and monitoring for a change in the output signal received by the electronics assembly.


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