The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Nov. 25, 2015
Applicant:

William Marsh Rice University, Houston, TX (US);

Inventors:

Mayank Kumar, Houston, TX (US);

Ashok Veeraraghavan, Houston, TX (US);

Ashutosh Sabharwal, Houston, TX (US);

Assignee:

William Marsh Rice University, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/024 (2006.01); A61B 5/11 (2006.01); G06K 9/00 (2006.01); G06K 9/20 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0077 (2013.01); A61B 5/02416 (2013.01); A61B 5/02427 (2013.01); A61B 5/1114 (2013.01); A61B 5/7221 (2013.01); A61B 5/7235 (2013.01); A61B 5/7253 (2013.01); G06K 9/00771 (2013.01); G06K 9/2027 (2013.01); G06K 9/4642 (2013.01); G06K 9/4661 (2013.01);
Abstract

A system for estimating a photoplethysmogram waveform of a target includes an image processor configured to obtain images of the target and a waveform analyzer. The waveform analyzer is configured to determine a weight of a portion of the target. The weight is based on a time variation of a light reflectivity of the portion of the target. The time variation of the light reflectivity of the target is based on the images. The waveform analyzer is further configured to estimate a PPG waveform of the target based on the weight of the portion and the time variation of the light reflectivity of the portion.


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