The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2018
Filed:
Apr. 25, 2016
Original Inc., San Francisco, CA (US);
Chong-Jin Koh, San Francisco, CA (US);
Original Inc., San Francisco, CA (US);
Abstract
The technology disclosed relates to methods usable for determining measurements for custom clothing manufacture, including receiving a raw image of a clothing article and a scale reference, and applying perspective correction to adjust the raw image to produce an adjusted image. The method also includes determining a scale reference from the adjusted image, for use with a line measurement tool; and receiving user inputs that positions ends of the line measurement tool on measurement reference positions on the adjusted image of the clothing article. The method further includes generating multiple clothing article distances between the measurement reference positions on the adjusted image of the clothing article using the line measurement tool; and storing at least three clothing article distances for use in producing a custom clothing article with a fit based on the favorite clothing article in the raw image.