The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Jul. 16, 2013
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Gururaj Gopal Putraya, Bangalore, IN;

Basavaraja S V, Bangalore, IN;

Mithun Uliyar, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23238 (2013.01); G06T 3/4038 (2013.01); G06T 2200/21 (2013.01); G06T 2207/10052 (2013.01);
Abstract

A method, apparatus, and computer program product for generating a seamless and error-free panorama image using a selective set of views from a multi-view image from each of the several captured light field (LF) images. The method identifies the view and corresponding image for each captured LF image which has the same or closely located center of projection with the views of neighboring LF images. Image registration and warping techniques are applied across the images and the parallax error is calculated which indicates the closeness of their center of projections. The view from each LF captured image with minimal parallax error is selected and stitched together with the other views identified as having minimal parallax error.


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