The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Dec. 18, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kohei Furuya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2011.01); H04N 5/357 (2011.01); H04N 5/359 (2011.01); H04N 5/369 (2011.01); H04N 9/04 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/217 (2013.01); H04N 5/359 (2013.01); H04N 5/3572 (2013.01); H04N 5/3696 (2013.01); H04N 9/045 (2013.01); H04N 5/23212 (2013.01);
Abstract

An image processing apparatus and an image processing method capable of discriminating with good precision a cause of image degradation that occurs in a value of a pixel adjacent to a focusing pixel, and of appropriately performing correction. When correcting a value of an imaging pixel adjacent to a focusing pixel, it is determined whether the value of the correction target pixel is influenced by flare based on a value of an imaging pixel adjacent to the focusing pixel that exists in a vicinity of a correction target pixel, and values of a plurality of imaging pixels that exist in a vicinity and are not adjacent to the focusing pixel. An appropriate method for correcting the influence of flare is used if it is determined that the value of the correction target pixel is influenced by flare.


Find Patent Forward Citations

Loading…