The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Sep. 30, 2015
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Sarma V. Vangala, San Jose, CA (US);

Tarik Tabet, Los Gatos, CA (US);

Swaminathan Balakrishnan, Santa Clara, CA (US);

Yuchul Kim, Santa Clara, CA (US);

Navid Damji, Cupertino, CA (US);

Sreevalsan Vallath, Dublin, CA (US);

Samy Khay-Ibbat, San Francisco, CA (US);

Syed Aon Mujtaba, Santa Clara, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04L 12/26 (2006.01); H04W 24/06 (2009.01); H04W 24/08 (2009.01); H04B 17/309 (2015.01);
U.S. Cl.
CPC ...
H04L 43/0888 (2013.01); H04B 17/309 (2015.01); H04L 43/10 (2013.01); H04W 24/06 (2013.01); H04W 24/08 (2013.01);
Abstract

Loading estimation of 3GPP networks. One or more metrics relating to a cell of a 3GPP network may be measured. Loading of the cell may be estimated based on the one or more metrics. The metrics may include metrics measured, estimated, or derived at multiple layers, possibly including one or more of physical layer, radio link control layer, radio resource control layer, or application layer metrics.


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