The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Nov. 13, 2015
National Instruments Corporation, Austin, TX (US);
MinKeun Chung, Austin, TX (US);
Jaeweon Kim, Cedar Park, TX (US);
James W. McCoy, Leander, TX (US);
Ahsan Aziz, Austin, TX (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
Techniques are disclosed relating to channel quality reporting for full-duplex (FD) wireless communications. In some embodiments an apparatus (e.g., a mobile device) is configured to receive a reference signal in a wireless communication and determine an effective signal to interference plus noise ratio (SINR) for FD communications based on a measured SINR of the reference signal and one or more self-interference cancelation levels. The apparatus may determine the one or more self-interference cancelation levels based on the transmit power of signals transmitted by the apparatus and residual power after SIC. The SIC levels may include both analog and digital SIC levels, which may be separately determined. One or more modulation and coding schemes may be determined based on the effective SINR. In some embodiments, multiple effective SINRs are determined for multiple different transmission modulation orders used by the apparatus.