The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Aug. 10, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jawaharlal Tangudu, Bangalore, IN;

Chandrasekhar Sriram, Chennai, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03M 1/08 (2006.01);
U.S. Cl.
CPC ...
H03M 1/08 (2013.01); H03M 1/0836 (2013.01); H03M 1/0854 (2013.01);
Abstract

Circuitry for correcting non-linearity of an analog-to-digital converter. A non-linearity correction system for an analog-to-digital converter (ADC) includes coefficient storage, coefficient transformation circuitry, and correction circuitry. The coefficient storage is encoded with a first set of coefficients for correcting non-linearity of the ADC at a first sampling rate. The coefficient transformation circuitry is coupled to the coefficient storage. The coefficient transformation circuitry is configured to generate a second set of coefficients for correcting non-linearity of the ADC at a different sampling rate. The correction circuitry is configured to apply the second set of coefficients to correct non-linearity in output of the ADC while the ADC is operating at the different sampling rate.


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