The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Mar. 27, 2017
Orbital Insight, Inc., Mountain View, CA (US);
Boris Aleksandrovich Babenko, Mountain View, CA (US);
Alexander Bogdanov Avtanski, San Jose, CA (US);
Jason D. Lohn, Los Gatos, CA (US);
Orbital Insight, Inc., Mountain View, CA (US);
Abstract
Disclosed is a method and system for processing images from an aerial imaging device. An image of an object of interest is received from the aerial imaging device. A parameter vector is extracted from the image. Image analysis is performed on the image to determine a height and a width of the object of interest. Idealized images of the object of interest are generated using the extracted parameter vector, the determined height, and the determined width of the object of interest. Each idealized image corresponds to a distinct filled volume of the object of interest. The received image of the object of interest is matched to each idealized image to determine a filled volume of the object of interest. Information corresponding to the determined filled volume of the object of interest is transmitted to a user device.