The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
May. 02, 2017
Sas Institute Inc., Cary, NC (US);
North Carolina State University, Raleigh, NC (US);
Christopher Graham Healey, Cary, NC (US);
Samuel Paul Leeman-Munk, Cary, NC (US);
Shaoliang Nie, Raleigh, NC (US);
Kalpesh Padia, Raleigh, NC (US);
Ravinder Devarajan, Cary, NC (US);
David James Caira, Chapel Hill, NC (US);
Jordan Riley Benson, Ellerbe, NC (US);
Saratendu Sethi, Raleigh, NC (US);
James Allen Cox, Cary, NC (US);
Lawrence E. Lewis, Raleigh, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Deep neural networks can be visualized. For example, first values for a first layer of nodes in a neural network, second values for a second layer of nodes in the neural network, and/or third values for connections between the first layer of nodes and the second layer of nodes can be received. A quilt graph can be output that includes (i) a first set of symbols having visual characteristics representative of the first values and representing the first layer of nodes along a first axis; (ii) a second set of symbols having visual characteristics representative of the second values and representing the second layer of nodes along a second axis; and/or (iii) a matrix of blocks between the first axis and the second axis having visual characteristics representative of the third values and representing the connections between the first layer of nodes and the second layer of nodes.