The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Jun. 03, 2014
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Abhishek Tripathi, Bangalore, IN;

Avinash Sharma, Bangalore, IN;

Anirban Mondal, Bangalore, IN;

Kuldeep Yadav, Haryana, IN;

Nischal Murthy Piratla, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30241 (2013.01); G06F 17/30327 (2013.01); G06F 17/30528 (2013.01); G06F 17/30551 (2013.01); G06F 17/30554 (2013.01);
Abstract

The present disclosure is directed to systems and methods for context-aware and personalized access to data corresponding to an event. The data is related to multiple predefined parameters including a location, date, time, and a classifier representing a status or an impact intensity for the event. The method includes receiving the data and an event type for the data. The event type is selected from multiple predefined event types. The method also includes creating a hierarchical data structure configured to spatially index the data based on the selected event type. The hierarchical data structure includes a node representing the selected event type. The node is augmented using a linked list for referring to the data to be stored in a database. The node is associated with a frequency of occurrence of the selected event type.


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