The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Mar. 11, 2016
Applicant:

Panaya Ltd., Raanana, IL;

Inventors:

Yossi Cohen, Raanana, IL;

Mati Cohen, Raanana, IL;

Nurit Dor, Raanana, IL;

Dror Weiss, Raanana, IL;

Assignee:

Panaya Ltd., Hod Hasharon, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 9/44589 (2013.01);
Abstract

System, method, and non-transitory computer-readable medium for generating a test scenario template from runs of test scenarios run on software systems belonging to different organizations, including: clustering the runs to clusters comprising similar runs of test scenarios; selecting from the clusters a certain cluster comprising a first run of a first test scenario and a second run of a second test scenario belonging to different organizations. At least 95% of values used in the first run of the first test scenario are provided automatically by a test script. And generating a test scenario template representing the certain cluster, wherein the test scenario template identifies a transaction used in the first and second runs, and possible values for running the transaction.


Find Patent Forward Citations

Loading…