The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Mar. 11, 2016
International Business Machines Corporation, Armonk, NY (US);
James W. Pickel, Gilroy, CA (US);
Pallavi Priyadarshini, Bangalore, IN;
Mamta Sharma, Bangalore, IN;
Parameswara R. Tatini, Bangalore, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
As disclosed herein a method, executed by a computer, for enabling multi-tiered software stack diagnostic collection includes initiating, on a first tier of a multi-tiered software stack, a targeted diagnostics collection corresponding to a symptom of a failure, determining a symptom to a reason code mapping corresponding to the symptom in a product of a subsequent tier, and issuing a command to the product of the subsequent tier to initiate targeted diagnostics collection corresponding to the reason code. Problems or failures in a multi-tiered software stack environment may require analyses of programs or products corresponding to each tier of a multi-tiered software stack. The method described herein enables simultaneous collection of diagnostics for programs or products corresponding to each tier of a multi-tiered software stack. A computer system, and a computer program product corresponding to the method are also disclosed herein.