The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Sep. 21, 2015
Advanced Testing Technologies, Inc., Hauppauge, NY (US);
Eli Levi, Dix Hills, NY (US);
William Biagiotti, St. James, NY (US);
Eli Levi, Dix Hills, NY (US);
Robert Spinner, East Northport, NY (US);
Advanced Testing Technologies, Inc., Hauppauge, NY (US);
Abstract
Method and arrangement for displaying a digital waveform in an eye diagram simultaneously with an indication of acceptability of the digital waveform. A decoded digital waveform is separated into overlapping waveform permutations based on a number of digital states and transition points in the eye diagram. Submasks equal in number to the waveform permutations and that are derived from a common, known good waveform, are retrieved from a memory component. Each retrieved submask is applied to a corresponding waveform permutation to determine any locations at which the waveform permutation exceeds a boundary of the submask. Only one submask is applied to each waveform permutation. The waveform is displayed in the eye diagram simultaneous with a visual indication of the locations at which any of the waveform permutations exceeds the boundary of the corresponding submask, to enable visual assessment of the acceptability/validity of the digital waveform.