The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
May. 18, 2017
Oki Data Corporation, Tokyo, JP;
Masato Hirano, Tokyo, JP;
Oki Data Corporation, Tokyo, JP;
Abstract
A drum unit includes a photosensitive drum and a cleaning member. A scratch remaining depth measured by a scratch test of the photosensitive drum under a following Test Condition 1 is 110 nm or less. Test Condition 1 is; test environment temperature=25° C.; test environment humidity=50%; test indenter=pre-mount type Berkovich indenter; scratch direction=horizontal direction; scratch speed=20 μm/sec; initial load=0 mN; maximum reaching load=4 mN; and load at the time of measuring the scratch remaining depth=1.9 mN.
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