The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Apr. 29, 2013
Applicant:

National Chiao Tung University, Hsinchu, TW;

Inventors:

Ching-Cherng Sun, Yangmei, TW;

Yeh-Wei Yu, Pingzhen, TW;

Chih-Yuan Cheng, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/32 (2006.01); G02B 21/36 (2006.01); G03H 1/04 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); G03H 1/04 (2013.01); G03H 1/041 (2013.01); G03H 1/0408 (2013.01); G03H 1/0443 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0419 (2013.01); G03H 2001/0439 (2013.01); G03H 2001/0445 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0469 (2013.01); G03H 2001/0471 (2013.01); G03H 2222/52 (2013.01); G03H 2222/53 (2013.01); G03H 2223/16 (2013.01);
Abstract

A manufacturing method of an optical element applied to a miniature microscope includes the steps of: emitting a signal light and a reference light to an optical material; and forming a plurality of gratings on the optical material by interfering the signal light and the reference light. A miniature microscope is also disclosed.


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